Native point defects in yttria as a high-dielectric-constant gate oxide material: a first-principles study

-Yttria (Y2O3) has become a promising gate oxide material to replace silicon dioxide in metal-oxide-semiconductor (MOS) devices. The characterization of native point defect in Y2O3 is essential to understand the behavior of the material. We used the firstprinciples pseudopotential method to study the electronic structure, defect structure and formation energy of native point defects in Y2O3. Vacancies, interstitials and antisites in their relevant charge states are considered. The dominant defect types are identified under different chemical potentials and different Fermi levels. Oxygen vacancies are the dominant defect types under high yttrium chemical potential condition. Lower yttrium chemical potential leads to oxygen interstitials and ultimately yttrium vacancies when Y2O3 is used as a high dielectric constant gate oxide material in MOS devices.